User manual LEICA CLEANLINESS EXPERT BROCHURE

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Manual abstract: user guide LEICA CLEANLINESS EXPERTBROCHURE

Detailed instructions for use are in the User's Guide.

[. . . ] Leica Cleanliness Expert The new analysis software for measurement and classification of particles on filters. Living up to Life The Expert for Quality Assurance Critical Quality Factors The lifetime and functionality of engineering components often depend on the cleanliness of their surface after the production process as tiny dirt particles affect their reliability and durability. Leica Cleanliness Expert is a quantitative Quality Assurance system that helps monitor the quality of components during the manufacturing process. Reliability by experience With critical system components continuously being miniturised, cleanliness monitoring systems and analysing software need to be adapted and improved. [. . . ] · Limitless feature length detection function for the accurate measurement of large and small particles at the same magnification. · Access to measured particle data for artefact removal and further data processing · Fully compliant with the latest standards (ISO 16232 and VDA 19) implemented in cleanliness detection. · User management to avoid unauthorised alterations of settings. Automated for Simplicity, Speed and Accuracy How does it work?The system automatically measures filters where cleaning fluid of micro mechanic and engine components has been poured through, and dried in an oven. The size and number of particles measured on these filters are used for characterising the cleanliness of the components to international quality requirements or to those defined by the customer. The clear user interface, established within Leica Application Suite (LAS), makes it easy to generate new configurations by simple copying and editing existent ones. Leica Cleanliness Expert is designed to automatically measure circular filters with arbitrary diameters, without having to specify a scanning pattern, using a motorised microscope stage. The number of bin classes and class limits can be freely defined to suit all requirements and to comply with company or international standards. Measurements can be undertaken in compliance to the ISO 16232 and VDA 19 standards and as such, all parameters are fixed and result formats predefined. Leica Cleanliness Expert provides an auto detection mode to minimise user influence. It also allows all results, including the raw measurement data, to be exported to MS® ExcelTM for further advanced data processing so that results are clearly visable and comparable. Arbitrary settings of parameter limits for the selection of specific particle types make it easy to adapt the system to special requirements, for example, particle characterisation and classification in Quality Assurance close to the production line. The intuitive user interface guides you through each function, making it significantly quicker and easier to operate. Each detected feature can be defined referring to geometric parameters and optical behavior such as length, width and aspec ratio, to seperate fibres from compact particles as well as to differentiate between reflective and nonreflective features. The results for all these different types of features can be classified in an unlimited number of bin classes with selectable bin limits. Selectable limits for the number of particles allowed for each class can be defined and end up in OK/n. OK for each class or for the whole sample respectively. [. . . ] Cleanliness Operator: Guided workflow though the analysis (changing the filters, input of measurement specific data, setting up the image, focus, starting the measurement, store and print data). Illustrations, descriptions and technical data are not binding and may be changed without notice. Printed on chlorine-free paper with a high content of recycled fibre. 10IDI11010EN · © Leica Microsystems (Switzerland) Ltd · CH-9435 Heerbrugg, 2009 · Printed in Switzerland ­ V. 2006 ­ RDV For further information, please contact your local Leica representative: www. leica-microsystems. com [. . . ]

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