User manual OMRON F500 DATASHEET

[. . . ] Searching is possible with shape information, such as "circle, " "rectangle, " or "intersection. " This achieves higher precision in measurements than conventional pattern matching methods. Reference data: Repeatability is within 1/20 pixel (OMRON test data) Appearance Inspections 250, 000 pixels (previous systems) 1 million pixels 1-million-pixel Camera with Digital Interface The video signal noise that hurt measurement precision has been greatly reduced to enable inspections of minute foreign matter or damage as well as highprecision positioning. EC Defect Geometric information is used to measure minute defects or lowcontrast scratches in the measurement object at high precision. Stable detection is possible for applications like measuring deformation in O-rings. EC Circle Count Circles are searched for based on a circle of a specified size. Stable detection is possible without undue influence by deformation or dirt. [. . . ] (See note 2. ) And what's more, the images from several Controllers connected via the network can be monitored simultaneously on the computer screen. Vision Composer Net Live transfer via Ethernet Monitor and adjust Controllers and manage data. LIVE Router Factory Router Factory LAN Monitor live images. Note 1: The transfer speed of live images depends on the network environment. 2: Remote monitoring is not possible through a firewall. Remote Operations Download Setup Function 1 Transfer setting data across the network. Network Vision Sensor A Vision Sensors in different production lines Management Host can be easily set up. Downloading is also useful when changing products or using new programs. Checking and switching Vision Sensor settings Downloading new settings, and more Vision Sensor measurements can be started and stopped and scene data settings can be specified from a remote computer. All operations that were previously possible from the Console can be performed remotely from a computer. Factory Office Network Vision Sensor B Remote controller Network Vision Sensor C 1 Scheduled for release soon. C-58 Vision Systems Applications Connector and IC Lead Inspections Molded Product Defect Inspections Pitch Length High-resolution inspection over a wide field of view is enabled by using a 1-million-pixel highresolution camera. And with macro functions, the statistics on lead pitch data and linear approximations of the lead ends are easily performed. No. of leads Misshapen products, as well as contamination and scorching around molded products, can be detected. Setting is as easy as specifying the circle size to detect (i. e. , the size of the defects) on limit samples displayed on the monitor. With macros, statistics on good products, NG products, and fault rates for the inspections performed each day can be calculated and logged in a Memory Card. Combining networking enables changing inspection devices, managing master data, and uploading statistical data files with macros. BGA Inspections Ceramic Board Defect Inspection Number of balls Deformed ball Offset ball Incorrect position Ball size High-resolution inspection over a wide field of view is also enabled by using a 1-million-pixel high-resolution camera with BGA inspection software. Variant BGA processing is also possible. Image Taken Filtering Again Filtering Again EC Defect Inspection Inspect for cracks on the surface of ceramic boards. Even if uneven lighting or rough surfaces show in the images, linear aspects can be consistently detected. Using the flow menus enables conversion to more stable inspection by repeatedly filtering images. Quality control data can be used effectively by storing inspection images in relation to lot numbers. Managing all of the product data on the host computer makes frequent changes to settings much smoother. Inspecting Electrolytic Capacitor Dimensions Positioning Liquid Crystal Boards The diameter of round workpieces can be measured at multiple points to determine if they are round or not. With macros, deviations in inspection values can be stored in memory and statistics, such as minimum values, maximum values, and standard deviations, can be calculated. EC processing, based on an original algorithm from OMRON, enables position inspections of low-contrast alignment marks. And using a Digital Interface Camera enables stable processing. Macros can also be used to easily achieve original calibration methods, inspection data calculations, and much more. Managing productivity is also possible by saving and reviewing inspection images, detection data, and position compensation data. Chip Capacitor Electrode Defect Inspection Printing Defects Even if the size of the inspection object changes, the size of the inspection area adjusts to the external size to enable measurement. Misshapen products and contamination and scorching around products can be detected. [. . . ] 270 g Instruction Manual System Requirements for F500-CD2E Vision Composer Net CPU OS Memory Hard disk Monitor Network Vision Sensor Controller Application Software Pentium III 600 MHz min. recommended) Windows 2000 Professional, Service Pack 3 or higher Windows XP Home Edition, Service Pack 1 or higher Windows XP Professional, Service Pack 1 or higher 192 MB min. available space Resolution: 1, 024 x 768 min. Display colors: High Color (16-bit) min. [. . . ]