User manual ZEISS AXIOSKOP

[. . . ] Main assemblies and their characteristics . 11 11 12 14 15 18 B 40 016 e 09/95 I Axiolab Pol Page 2 2. 1 2. 2 2. 3 2. 4 2. 5 2. 6 2. 6. 1 2. 6. 2 2. 6. 3 2. 6. 4 2. 7 2. 7. 1 2. 7. 2 2. 7. 3 2. 7. 4 2. 7. 5 2. 7. 6 2. 7. 7 2. 8 2. 8. 1 2. 8. 2 2. 8. 3 OPERATION Setting up the unit . Reflected light bright field (for equipment 0. 3 and 0. 5 only - Axiolab Pol with reflected lighting) . Reflected light polarisation (for equipment 0. 3 and 0. 5 only - Axiolab Pol with reflected lighting) . [. . . ] Retighten the retaining screw (2 24/4) vigorously and only then retighten the screw (2 24/3). B 40 016 e 09/95 2 31 Axiolab Pol (3) Replacing the reflected light lamp (for equipment 0. 3 and 0. 5 only) Proceed as follows when using other reflecting lighting: · Dismantle the lamp HAL 6 V 25 W (447206) in the reverse order to the assembly description in Section 2. 1 (4). · It is imperative to observe the single operating instructions listed below with regard to operation, installation and replacement of the halogen lamp HAL 100 W, a mercury short arc lamp HBO 50 or the Xenon short arc lamp XBO 75: G 42 216/I e microscope lamp HAL G 42 160/I e microscope lamp with HBO 50 G 42 165/e microscope lamp with HBO 100 or XBO 75 NOTE In the reflected light tube, the Axiolab Pol microscope has a permanently installed screen and so the lamp must be adjusted with the lamp detached. · Install the lamp or light source and connect it to the external power supply unit as described in the above mentioned instructions. 1 m, project the helix or the image of the light source onto a wall surface. To improve imaging, use a hole diaphragm that you have produced yourself (hole diameter approx. 1 cm) and hold in front of the lamp's light outlet opening. Therefore, never leave such aids on the lamp for a prolonged period of time and unsupervised!Never view directly into these high power lamps!The other regulations for your safety, as detailed in the instruction manuals, must be observed strictly!· Adjust the lamp helix or light source image as described in the above mentioned instructions. · Fit the lamp on the stand as described in Section 2. 1 (4). In doing so, orient the lamp housing perpendicular to the stand so that the lamp mount points downwards (no orientation point available). · Prepare the microscope as described in Sections 2. 6. 1, 2. 6. 2 (1) and (2). NOTE Do not use a specimen for the further adjustment steps! · Swivel in the polariser (2 28/3) - bottom flap - up to the latching point and observe extension (dimming of the field of vision without a specimen) at the full light output. If this is not optimum, use a small screwdriver to correct the position of the polariser's oscillation direction by turning slightly and sensitively on the holder - use the adjustment slots (2 28/4) until maximum extension has been achieved. · After removing the dust protection slide, slide the affiliated compensator slide l/4 (2 28/5) into the compensator slot and swivel in the l/4 plate (2 28/2) - top flap - on the circular polariser D. 5 4 1 2 3 2 Figure 2 28 Circular polarisation unit 2 36 09/95 B 40 016 e Axiolab Pol · On the control for the rotary bearing (2 28/1), turn the plate until maximum extinction (dark grey field of vision) is achieved (the lever points 45° to the right). · An (anisotropic) specimen should not be observed until the above mentioned adjustments have been made. Specimens appear constant and, independently of rotation of the stage, in their interference colour, which depends on the material, the thickness of the specimen and its orientation. NOTE For an image rich in contrast, when using higher lens magnification factors (as from approx. 20x) reduce the illumination aperture to a value between 0. 15 - 0. 20, i. e. close the aperture diaphragm accordingly. 2. 7. 7 Assembly and use of a phase contrast unit (accessory 445303 or 445366) Phase contrast is used to contrast undyed specimens (phase specimens), to depict refractive index differences, e. g. as the result of growth homogeneities or to determine the refractive index more precisely in accordance with the embedding method using immersion fluids of differing refraction (see Section 3. 1. 2 (2)). This method requires the following additions: · For equipment 0. 1 to 0. 3: ABBE condenser 0. 9/1. 25 with 5 fold turret disk for bright field, for phase contrast, the ring diaphragms Ph1, Ph2, Ph3 or dark field (0. 65/0. 9) - for the CP Achromat 40x/0. 65 (accessory 445303) · For equipment 0. 4 and 0. 5: for the achr. [. . . ] 4, 418 - 426, 1953 El Hinnawi: Methods in Chemical and Mineral Microscopy Elsevier Publishing Company, Amsterdam London New York 1966 Emons, H. H. : Chemische Mikroskopie Deutscher Verlag für Grundstoffindustrie, Leipzig 1973 Freund, H. (Herausgeber): Handbuch der Mikroskopie in der Technik - 8 Bände Umschau Verlag, Frankfurt am Main 1954 ff. Gahm, J. : Quantitative polarisationsoptische Messungen mit Kompensatoren ZEISS Mitteilungen 3, 153 - 192, 1964 Galopin, R. , und Henry, N. F. M. : Microscopy study of opaque minerals Heffer and sons, Ltd. , Cambridge 1972 Heinrich, E. [. . . ]