User manual HAMEG HM203-4

[. . . ] The unit exhibits visible damage The unit contains loose parts The unit no longer functions The unit has been stored under unfavorable conditions (e. Out of doors or in a moist area) for a long period of time The unit has been subjected to ahnornial stresses during transport (e. As a result of not being packaged in accordance with the minirnurn requirements of the postal service, railway or shipping company). The BNC jacks and the black banana jack are grounded by way of the 3-conductor power cord of the HZ65. [. . . ] Damage caused during transport by inadequate packaging is exempted from the warranty. When exercising this warranty, we advise attaching a note to the housing of the unit briefly deseribing the observed fault or faults. You will receive faster service if you include your name and telephone number (including area code and extension or department designation) in case we require additional information. If the unit has been kept at temperatures below the dew point (the temperature at which water vapour begins to condense), then it must be acclimated for a certain minimum time period before powering up. In extreme cases (if the HZ65 is much colder than the dew point), it is necessary to wait approx. 2 hours at room temperature before beginning operation. The unit is designed for use in clean, dry roorns. It must not be operated if there is a high incidence of airborne dust, high relative humidity, risk of explosions, or if aggressive chemicals are present in the environment. The unit may be operated in any position, provided that there is unhindered air circulation (convection cooling). Warning When opening or closing the enclosure, when performing repairs or maintenance, and when replacing parts. The unit must be isolated from all voltage sources. If the leads are open, a horizontal line will result. Capacitors and inductors cause a phase difference between current and voltage, and thus between the 2 deflection voltages. In the case of semiconductors, a voltage-induced sharp change in direction in the curve can be observed at the transition point from the conductive to the nonconductive state. To the extent permitted by the applied test voltage, the forward and reverse characteristics of semiconductor components are displayed (e. Only 2-point measurements can be performed; for this reason, transistor gain and the like cannot be measured with the HZ65. Since only a few volts are applied to the test object, non-destructive testing is possible of the individual zones of almost all semiconductors. Direct in-circuit testing is possible in rnany cases, however, parallel circuits with other, complex components can cause significant changes in the curve traces. Nevertheless, with a certain amount of experience or by comparing with the traces of known functional circuits, faulty components can be quickly identified. In cases of doubt, one of the component leads can be desoldered. Carry out tests with the HZ 65 only in circuits in which no currents are flowing (otherwise there is a risk of damage to the circuit and the tester). Oscilloscope types The HZ 65 can be connected to any oscilloscope with X and Y inputs (in X-Y mode or external X deflection). [. . . ] For example, it is possible to quickly determine which lead is the cathode on a diode or zener diode with illegibly printed designations, to identify NPN or PNP transistors, or to obtain emitterbase-collector identification on unknown transistor types. Even more important is the ability to quickly obtain a good-bad evaluation of components in the case of interruptions or shorts, which experience has shown is what servicing jobs most often require. It is urgently advised to exercise the usual caution when handling individual MOS components as regards electrostatic charges. It is not quite as simple to obtain usable results when performing in-circuit testing. [. . . ]