User manual TEKTRONIX TDS 500D

[. . . ] User Manual TDS 500D, TDS 600B & TDS 700D Digitizing Oscilloscopes 071-0130-03 This document applies for firmware version 1. 0 and above. Copyright E Tektronix, Inc. Licensed software products are owned by Tektronix or its suppliers and are protected by United States copyright laws and international treaty provisions. Use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at DFARS 252. 227-7013, or subparagraphs (c)(1) and (2) of the Commercial Computer Software ­ Restricted Rights clause at FAR 52. 227-19, as applicable. and foreign patents, issued and pending. [. . . ] The oscilloscope will continuously update and display these measurements. Automatic measurements are taken over the entire waveform record or, if you specify gated measurements (see page 3­130), over the region specified by the vertical cursors. Automated measurements are not taken just on the displayed portions of waveforms. The oscilloscope can also display almost all of the measurements at once -- see Take a Snapshot of Measurements on page 3­135. Measurement List The TDS Oscilloscope provides you with automatic measurements. Table 3­11 lists brief definitions of the automated measurements in the oscilloscope (for more details see Appendix B: Algorithms, page B­1). Table 3­11: Measurement definitions Name Amplitude Definition Voltage measurement. The high value less the low value measured over the entire waveform or gated region. Amplitude = High ­ Low Area Cycle Area Voltage over time measurement. The area over the entire waveform or gated region in volt-seconds. Area measured above ground is positive; area below ground is negative. The area over the first cycle in the waveform, or the first cycle in the gated region, in volt-seconds. Area measured above ground is positive; area below ground is negative. Measured over the entire waveform or gated region. The arithmetic mean over the first cycle in the waveform or the first cycle in the gated region. Burst Width Cycle Mean 3­126 TDS 500D, TDS 600B, & TDS 700D User Manual Measuring Waveforms Table 3­11: Measurement definitions (cont. ) Name Cycle RMS Delay Fall Time Definition Voltage measurement. The true Root Mean Square voltage over the first cycle in the waveform or the first cycle in the gated region. The time between the MidRef crossings of two different traces or the gated region of the traces. Time taken for the falling edge of the first pulse in the waveform or gated region to fall from a High Ref value (default = 90%) to a Low Ref value (default =10%) of its final value. Timing measurement for the first cycle in the waveform or gated region. Measured in Hertz (Hz) where 1 Hz = 1 cycle per second. The value used as 100% whenever High Ref, Mid Ref, and Low Ref values are needed (as in fall time and rise time measurements). Calculated using either the min/max or the histogram method. The min/max method uses the maximum value found. The histogram method uses the most common value found above the mid point. [. . . ] The time base determines when and how long to acquire record points. Timeout trigger A trigger mode in which triggering occurs if the oscilloscope does NOT find a pulse, of the specified polarity and level, within the specified time period. Trigger An event that marks time zero in the waveform record. It results in acquisition and display of the waveform. [. . . ]